Hitachi High-Tech launches Easy-to-Use Models of Atomic Force Microscopes

By OEM Update Editorial June 24, 2021 4:03 pm IST

These models are designed to offer ease-of-use and superior reliability for high-throughput R&D or quality control applications.

Hitachi High-Tech Corporation announced the launch of both AFM100 and AFM100 Plus systems – entry-level and intermediate-level models of Hitachi’s compact and versatile Atomic Force Microscopes (AFM). 

The AFM can provide both high-resolution visualisation of surface morphology and simultaneous mapping of various other physical properties at the nanoscale. Therefore, the AFM is intensively used for scientific research and development, as well as quality control across a wide range of industrial fields, such as examining battery materials, semiconductors, polymers, living organisms, etc.

Key benefits of these products are as follows:

• Improved usability, reliability, and total throughput

To make the cantilever loading/unloading much easier, a newly developed pre-mounted cantilever has been adopted and it can significantly improve the usability. In addition, these instruments come with an autopilot function that automatically optimises measurement parameters, controls the interaction force between the tip and the sample, and adjusts the scan speed, thus reducing human errors. Therefore, reliable and consistent data acquisition can be readily realised. The system also supports multi-point measurement with a recipe, which enables automated data collection and storage throughout the entire measurement process just by a single click, thus the total throughput can be dramatically increased.

•  Enhanced correlation with Hitachi High-Tech’s SEM

The optional AFM marking function uses Hitachi High-Tech’s originally developed Scanning Atomic and Electron Microscopy. It is a correlated imaging technique that improves compatibility between AFM and Scanning Electron Microscopes (SEM). Specifically, both the AFM and SEM can be used to examine the sample at the same locations, which enables a cross-platform, multifaceted analytical approach to achieve comprehensive characterisations of mechanical, electrical, and compositional properties of the sample.

• Scalable and durable

The system comes with the lifetime free download of new control software and a self-checking function that can automatically diagnose the root cause of malfunctions as standard, contributing to long service life for users. This allows users to keep their equipment up-to-date and performing at its highest level.

For more info, visit: https://www.hitachi.com/