NI lowers semiconductor test cost with RF measurement enhancements

By OEM Update Editorial October 26, 2016 7:21 am IST

National Instruments (NI), the provider of platform-based systems that enable engineers and scientists to solve the engineering challenges, announced new RF capabilities for higher power transmit and receive, and FPGA-based real-time envelope tracking and digital predistortion for the Semiconductor Test System (STS).

The latest in a series of STS enhancements, the high-power RF ports help manufacturers of RF front-end modules meet the expanded test requirements of RFICs and other smart devices while simultaneously helping to reduce cost. Because the RF ports exist in a fully integrated tester with the STS, RF test development time and cost may be decreased without sacrificing measurement accuracy or performance. Additionally, this integrated system eliminates the need for costly, bolt-on RF subsystems as required with traditional automated test equipment (ATE).

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